| | 1 | [[PageOutline]] |
| | 2 | |
| | 3 | = DMEAS Project Status Report = |
| | 4 | |
| | 5 | Period: 1Q09 |
| | 6 | == I. Major accomplishments == |
| | 7 | |
| | 8 | === A. Milestones achieved === |
| | 9 | '''__Milestone 1: Review all Substrate Technologies.__''' |
| | 10 | The objective of this milestone is to document the review of all (optical, wireless, edge compute, etc.) substrate technologies (list provided by GPO) in spiral-1 from a measurement and monitoring point of view based on the current version of GENI’s “Spiral 1 substrate catalog” [geni09_1]. Some prototype information has not been posted yet. Data plane measurements can be classified as embedded and external measurements that are required to monitor the physical layer characteristics on GENI. Therefore, all substrate technologies need to be examined to determine their embedded measurement capabilities in addition to the data plane measurements that prototypes offer. This milestone outlines these substrate technologies as they have been made available by the Spiral-1 prototypes. The embedded measurement capabilities for the substrate technologies are documented in “Embedded Measurements in substrate technologies” document [geni09_2]. Depending on needs assessment with control framework and real-time measurement capabilities, external measurement equipments will be investigated. |
| | 11 | |
| | 12 | '''__Milestone 2: Document Embedded Measurement Capabilities__''' |
| | 13 | The purpose of this milestone is to document embedded measurements capabilities of all substrate technologies. The embedded measurements capabilities of all substrate technologies is documented based on the current version (GENI-INF-PRO-S1-CAT-01.5) of GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet. Embedded measurements are readily accessible measurements on network nodes. Remote connectivity and access capabilities of these measurements are very important for a GENI researcher. |
| | 14 | |
| | 15 | |
| | 16 | === B. Deliverables made === |
| | 17 | * Milestone 1: Review all substrate technologies in spiral-1. |
| | 18 | * Milestone 2: Document embedded measurement capabilities. |
| | 19 | * Presentation at 4th GENI Engineering Conference , Miami , FL (March’ 09) |
| | 20 | * GENI Quarterly Report ( March’ 09) |
| | 21 | |
| | 22 | |
| | 23 | == II. Description of work performed during last quarter == |
| | 24 | |
| | 25 | === A. Activities and findings === |
| | 26 | '''1. Review all Substrate Technologies'''[[BR]] Review all substrate technologies milestone is achieved and the deliverable has been made to GENI. The objective of this milestone is to document the review of all (optical, wireless, edge compute, etc.) substrate technologies (list provided by GPO) in spiral-1 from a measurement and monitoring point of view based on the current version of GENI’s “Spiral 1 substrate catalog” [geni09_1]. The embedded measurement capabilities for the substrate technologies are documented in “Embedded Measurements in substrate technologies” document [geni09_2]. Depending on needs assessment with control framework and real-time measurement capabilities, external measurement equipments[[BR]] |
| | 27 | '''2. Document Embedded Measurement Capabilities'''[[BR]] Document Embedded Measurement capabilities milestone is achieved and the deliverable has been made to GENI. The embedded measurements capabilities of all substrate technologies is documented based on the current version (GENI-INF-PRO-S1-CAT-01.5) of GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet. Embedded measurements are readily accessible measurements on network nodes.[[BR]] |
| | 28 | '''3. Identify External Measurement Equipment'''[[BR]] This is our future milestone which is due May 30th 2009. The purpose of this milestone is to identify and document external measurements equipment (if any) and recommend where external measurement devices could benefit spiral-1.This milestone will document the possible external measurements equipments based on GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet. |
| | 29 | |
| | 30 | '''''Measurement equipments for wireless measurements:''''' |
| | 31 | * '''''Anritsu MS269xA Signal Analyzer with Mobile WiMAX Measurement Software:''''' IEEE802.16e RF signal characteristics |
| | 32 | * '''''JDSU G7104A Multimaster Base Station Tester:''''' Test and measure CDMA, WCDMA/HSPDA systems |
| | 33 | * '''''JDSU GC7105A Base Station Analyzer:''''' Test and maintenance of wireless communication systems |
| | 34 | * '''''JDSU GC7106A RF Analyzer:''''' Test and measure RF communication systems |
| | 35 | |
| | 36 | '''''Measurement equipments for optical measurements:''''' |
| | 37 | * '''''Anritsu MP1800A:''''' Signal Quality Analyzer at 40 Gbps with Remote control Ethernet/GPIB |
| | 38 | * '''''JDSU T-BERD/ MTS-8000:''''' Full 40 G testing, 1550 nm optics (per ITU-T and GR-253 standards), G.826 and G.828 performance measurements with configuration capability on application modules. |
| | 39 | * '''''Centellax TG1B1-A:''''' 10G BERT with GPIB control Interface. |
| | 40 | |
| | 41 | Some of the important desirable attributes for integrating external measurement equipment are:[[BR]] |
| | 42 | '''''Networking of External Measurement Instruments''''' |
| | 43 | * ''Remote access mechanisms:'' Ethernet, USB, other – include a computer (server) at each instrument site |
| | 44 | * Flexible API to interface with the aggregate managers across GENI Programmable vendor API/drivers to couple with GENI control frameworks |
| | 45 | * Planetlab interface, ''rspecs'' |
| | 46 | * ORCA interface, NDL |
| | 47 | * ProtoGENI interface, ''Emulab'' |
| | 48 | * ''Storage'' |
| | 49 | To identify the storage for experiment execution, data collection and analysis: on-instrument, on-network, local, at researcher’s access point. |
| | 50 | |
| | 51 | '''''Re-configuration and Programmability of External Measurements''''' |
| | 52 | * ''Configure measurement parameters'' |
| | 53 | * ''Configure measurement :'' |
| | 54 | * Optical power per wavelength channel, |
| | 55 | * At input of Infinera DTN at UH for the link between UH and Rice, |
| | 56 | * At a sampling frequency of 60 Hz. |
| | 57 | * Reconfiguration availability: [[BR]] E.g.: change sampling rate (need to know the range of configuration) |
| | 58 | * ''Re-program a measurement resource''[[BR]]Re-program a measurement resource according to what the analysis requirements dictate: |
| | 59 | * Local analysis and then report instead of continuous raw data reporting |
| | 60 | * Upload custom measurement software to instruments |
| | 61 | |
| | 62 | * ''Slice a measurement instrument for multiple user access'' |
| | 63 | |
| | 64 | Slicing of a measurement instrument similar to a resource being sliced – multiple researchers can access the same or different measurement parameters at the same time |
| | 65 | |
| | 66 | === B. Project participants === |
| | 67 | * Principal Investigator: Deniz Gurkan, Email id: dgurkan@central.uh.edu |
| | 68 | * SR Personnel: Paul Roberts, Email id: gproberts@tlc2.uh.edu |
| | 69 | * Graduate Student: Roopa Krishnappa, Email id: rkrishn9@mail.uh.edu |
| | 70 | |
| | 71 | === C. Publications (individual and organizational) === |
| | 72 | None. |
| | 73 | === D. Outreach activities === |
| | 74 | Connection with LEARN through D. Gurkan's ISSNet lab (Interoperable Smart Sensors and Networking Lab).Evaluation agreement with Infinera to host a DTN node at UH and Rice has been signed with LEARN (Lonestar Education and Research Network). |
| | 75 | === E. Collaborations === |
| | 76 | * '''LEARN''' (Lonestar Education and Research Network) |
| | 77 | * '''Real-time Measurements''' : Dr. Keren Bergman, Columbia University, New York |
| | 78 | * '''Cluster D''' : BEN |
| | 79 | Discussions with ORCA/BEN (with Ilia Baldine and Jeff Chase) on creation of measurement resource interfaces. |
| | 80 | |
| | 81 | === F. Other Contributions === |
| | 82 | None. |
| | 83 | |
| | 84 | '''BIBLIOGRAPHY''' |
| | 85 | |
| | 86 | 1. [geni09_1] GENI Project Office, “Spiral 1 substrate catalog”, 22 February 2009. |
| | 87 | |
| | 88 | 2. [geni09_2] GENI “Embedded Measurements in Substrate Technologies”, 01 March 2009. |
