Changes between Version 2 and Version 3 of D_MeasReport-1Q09


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Timestamp:
05/13/09 00:33:30 (13 years ago)
Author:
rkrishn9@mail.uh.edu
Comment:

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  • D_MeasReport-1Q09

    v2 v3  
    11= Data Plane Measurements Progress Report (1/1/2009-3/31/2009) =
    22
    3 == 1. Project Activities this Quarter ==
    4 === Review of Substrate Technologies ===
    5 === Embedded Measurements ===
    6 === Clusters' Embedded Measurement Status ===
     3== 1. Milestones achieved ==
    74
    8 == 2. Milestones achieved ==
     5== Milestone 1: Review all Substrate Technologies ==
     6The objective of this milestone is to document the review of all (optical, wireless, edge compute, etc.) substrate technologies (list provided by GPO) in spiral-1 from a measurement and monitoring point of view based on the current version of GENI’s “Spiral 1 substrate catalog” [geni09_1]. Some prototype information has not been posted yet. Data plane measurements can be classified as embedded and external measurements that are required to monitor the physical layer characteristics on GENI. Therefore, all substrate technologies need to be examined to determine their embedded measurement capabilities in addition to the data plane measurements that prototypes offer. This milestone outlines these substrate technologies as they have been made available by the Spiral-1 prototypes. The embedded measurement capabilities for the substrate technologies are documented in “Embedded Measurements in substrate technologies” document [geni09_2]. Depending on needs assessment with control framework and real-time measurement capabilities, external measurement equipments will be investigated.
    97
    10 Review of Substrate Technologies
     8== Milestone 2: Document Embedded Measurement Capabilities ==
     9The purpose of this milestone is to document embedded measurements capabilities of all substrate technologies. The embedded measurements capabilities of all substrate technologies is documented based on the current version (GENI-INF-PRO-S1-CAT-01.5) of GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet. Embedded measurements are readily accessible measurements on network nodes. Remote connectivity and access capabilities of these measurements are very important for a GENI researcher. [[BR]][[BR]]
    1110
    12 Embedded Measurements
    1311
    14 == 3. Deliverables made ==
     12
     13== 2. Deliverables made ==
     14•       Milestone 1: Review all substrate technologies in spiral-1.[[BR]]
     15
     16•       Milestone 2:  Document embedded measurement capabilities.[[BR]]
     17
     18•       Presentation at 4th GENI Engineering Conference , Miami , FL (March’ 09)[[BR]]
     19
     20•       GENI Quarterly Report ( March’ 09).[[BR]][[BR]]
     21
     22
     23== 3. DESCRIPTION OF WORK PERFORMED DURING LAST QUARTER ==
     24
     25''' 3.1 Activities and findings'''  [[BR]]
     26
     27''' 3.1.1       Review all Substrate Technologies''' [[BR]]
     28
     29Review all substrate technologies milestone is achieved and the deliverable has been made to GENI. The objective of this milestone is to document the review of all (optical, wireless, edge compute, etc.) substrate technologies (list provided by GPO) in spiral-1 from a measurement and monitoring point of view based on the current version of GENI’s “Spiral 1 substrate catalog” [geni09_1]. The embedded measurement capabilities for the substrate technologies are documented in “Embedded Measurements in substrate technologies” document [geni09_2]. Depending on needs assessment with control framework and real-time measurement capabilities, external measurement equipments will be investigated.
     30
     31''' 3.1.2    Document Embedded Measurement Capabilities '''  [[BR]]
     32
     33Document Embedded Measurement capabilities milestone is achieved and the deliverable has been made to GENI. The embedded measurements capabilities of all substrate technologies is documented based on the current version (GENI-INF-PRO-S1-CAT-01.5) of GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet. Embedded measurements are readily accessible measurements on network nodes.
     34
     35''' 3.1.3    Identify External Measurement Equipment ''' [[BR]]
     36
     37This is our future milestone which is due May 30th 2009. The purpose of this milestone is to identify and document external measurements equipment (if any) and recommend where external measurement devices could benefit spiral-1.This milestone will document the possible external measurements equipments based on GENI’s “Spiral 1 substrate catalog” [geni09_1], as well as on information from equipment vendors and the internet.
     38
     39'''''Measurement equipments for wireless measurements:'''''[[BR]]
     40
     41•       Anritsu MS269xA Signal Analyzer with Mobile WiMAX Measurement Software: IEEE802.16e RF signal characteristics[[BR]]
     42
     43•       JDSU G7104A Multimaster Base Station Tester: Test and measure CDMA, WCDMA/HSPDA systems[[BR]]
     44
     45•       JDSU GC7105A Base Station Analyzer: Test and maintenance of wireless communication systems[[BR]]
     46
     47•       JDSU GC7106A RF Analyzer: Test and measure RF communication systems[[BR]]
     48
     49
     50'''''Measurement equipments for optical measurements:'''''[[BR]]
     51
     52•       Anritsu MP1800A: Signal Quality Analyzer at 40 Gbps with Remote control Ethernet/GPIB[[BR]]
     53
     54•       JDSU T-BERD/ MTS-8000: Full 40 G testing, 1550 nm optics (per ITU-T and GR-253 standards), G.826 and G.828 performance measurements with configuration capability on application modules.[[BR]]
     55
     56•       Centellax  TG1B1-A: 10G BERT with GPIB control Interface.[[BR]][[BR]]
     57
     58
     59
     60Some of the important desirable attributes for integrating external measurement equipment are:[[BR]]
     61
     621.      '''Networking of  External Measurement Instruments'''[[BR]]
     63
     64•       ''Remote access mechanisms :'' Ethernet, USB, other – include a computer (server) at each instrument site[[BR]]
     65
     66•       ''Flexible API to interface with the aggregate managers across GENI''[[BR]]
     67
     68Programmable vendor API/drivers to couple with GENI control frameworks[[BR]]
     69
     70    o   Planetlab interface, rspecs[[BR]]
     71
     72    o   ORCA interface, NDL[[BR]]
     73
     74    o   ProtoGENI interface, Emulab [[BR]]
     75
     76•       ''Storage''[[BR]]
     77
     78To identify the storage for experiment execution, data collection and analysis: on-instrument, on-network, local, at researcher’s access point.[[BR]]
     79[[BR]]
     80
     81
     822.      '''Re-configuration and Programmability of External Measurements'''[[BR]]
     83
     84•       ''Configure measurement parameters''[[BR]]
     85
     86    o   ''Configure measurement :''[[BR]]
     87
     88        E.g.: [[BR]]
     89
     90        a) Optical power per wavelength channel, [[BR]]
     91
     92        b) At input of Infinera DTN at UH for the link between UH and Rice, [[BR]]
     93
     94        c) At a sampling frequency of 60 Hz.[[BR]]
     95
     96    o   ''Reconfiguration availability:'' [[BR]]
     97
     98        E.g. change sampling rate (need to know the range of configuration)[[BR]]
     99
     100•       ''Re-program a measurement resource''[[BR]]
     101
     102Re-program a measurement resource according to what the analysis requirements dictate:[[BR]]
     103
     104    o   Local analysis and then report instead of continuous raw data reporting[[BR]]
     105
     106    o   Upload custom measurement software to instruments[[BR]]
     107
     108•       ''Slice a measurement instrument for multiple user access''[[BR]]
     109
     110Slicing of a measurement instrument similar to a resource being sliced – multiple researchers can access the same or different measurement parameters at the same time.[[BR]][[BR]]
     111
     112
    15113
    16114
     
    21119Roopa Krishnappa – graduate student [[br]]
    22120
     121
    23122== 5. Publications (individual and organizational) ==
    24 None yet.
     123None yet.[[BR]]
     124
    25125
    26126== 6. Outreach activities ==
    27127Connection with LEARN through D. Gurkan's ISSNet lab (Interoperable Smart Sensors and Networking Lab)
    28 Evaluation agreement with Infinera to host a DTN node at UH and Rice has been signed with LEARN (Lonestar Education and Research Network).
     128Evaluation agreement with Infinera to host a DTN node at UH and Rice has been signed with LEARN (Lonestar Education and Research Network).[[BR]]
     129
    29130
    30131== 7. Collaborations ==
     132•       LEARN (Lonestar Education and Research Network)[[BR]]
     133
     134•       Real-time Measurements : Dr. Keren Bergman, Columbia University, New York[[BR]]
     135
     136•       Cluster D : BEN[[BR]]
    31137Discussions with ORCA/BEN (with Ilia Baldine and Jeff Chase) on creation of measurement resource interfaces.
     138[[BR]]
     139== 8.   Other Contributions ==
     140None.[[BR]]
     141
     142== 9.   BIBLIOGRAPHY ==
     143
     144[1] [geni09_1] GENI Project Office, “Spiral 1 substrate catalog”, 22 February 2009.[[BR]]
     145
     146
     147[2] [geni09_2] GENI “Embedded Measurements in Substrate Technologies”, 01 March 2009.[[BR]]
     148
     149